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High temperature stability embedded ReRAM for 2x nm node and beyond.

Gabriel MolasGiuseppe PiccolboniAlessandro BricalliAnthonin VerdyI. NaotY. CohenAmir RegevI. NavehDamien DeleruyelleQuentin RafhayNiccolo CastellaniL. ReganazAlain PersicoR. SegaudJean-François NodinV. MeliS. MartinFrançois AndrieuLaurent Grenouillet
Published in: IMW (2022)
Keyphrases
  • high temperature
  • embedded systems
  • stability analysis
  • dynamic random access memory
  • neural network
  • low cost
  • silicon dioxide
  • graph structure
  • sludge compost