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Fault detection and redundancy design for TSVs in 3D ICs.

Sai HuQin WangZheng GuoJing XieZhigang Mao
Published in: ASICON (2015)
Keyphrases
  • fault detection
  • fault diagnosis
  • fault detection and diagnosis
  • neural network
  • failure detection
  • fault isolation
  • artificial intelligence
  • pattern recognition
  • case based reasoning
  • design process