Efficient Delay Test Generation for Modular Circuits.

Nidhi Agrawal Parul Agarwal C. P. Ravikumar

Published in: Great Lakes Symposium on VLSI (1996)

Keyphrases

test generation
neural network
high speed
test sequences
symbolic execution
databases
real world
high quality
design automation
machine learning
image processing
training set
test cases
static analysis