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Efficient Delay Test Generation for Modular Circuits.

Nidhi AgrawalParul AgarwalC. P. Ravikumar
Published in: Great Lakes Symposium on VLSI (1996)
Keyphrases
  • test generation
  • neural network
  • high speed
  • test sequences
  • symbolic execution
  • databases
  • real world
  • high quality
  • design automation
  • machine learning
  • image processing
  • training set
  • test cases
  • static analysis