A New Approach to the Fault Location of Combinational Circuits.

Stephen Y. H. Su Yun-Chung Cho

Published in: IEEE Trans. Computers (1972)

Keyphrases

logic circuits
asynchronous circuits
fault diagnosis
fault detection
location information
high speed
genetic algorithm
fault models
control system
low power
multi agent
multiscale
digital circuits
computer vision
search engine
location and orientation
analog vlsi
single facility
real time