Scan-Out Power Reduction for Logic BIST.

Senling Wang Yasuo Sato Seiji Kajihara Kohei Miyase

Published in: IEICE Trans. Inf. Syst. (2013)

Keyphrases

power reduction
power consumption
built in self test
low power
power saving
end to end
computer vision
image processing
pattern recognition
object oriented
low cost
high speed
energy efficiency
power dissipation