A Generic Semi-Supervised Deep Learning-Based Approach for Automated Surface Inspection.
Xiaoqing ZhengHongcheng WangJie ChenYaguang KongSong ZhengPublished in: IEEE Access (2020)
Keyphrases
- deep learning
- semi supervised
- surface inspection
- unsupervised learning
- machine vision
- weakly supervised
- unsupervised feature learning
- photometric stereo
- machine learning
- supervised learning
- quality control
- labeled data
- unlabeled data
- surface defects
- active learning
- pairwise
- multi view
- domain specific
- named entity recognition
- vision system
- computer vision