Random Pattern Testability Enhancement by Circuit Rewiring.

Shih-Chieh Chang Kwen-Yo Chen Ching-Hsiang Cheng Wen-Ben Jone Sunil R. Das

Published in: VLSI Design (2001)

Keyphrases

pattern matching
high speed
image enhancement
circuit design
image processing
data sets
digital circuits
random selection
social network analysis
uniformly distributed
similar patterns
evolvable hardware
analog vlsi