Nonlinear decision boundaries for testing analog circuits.
Haralampos-G. D. StratigopoulosYiorgos MakrisPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2005)
Keyphrases
- analog circuits
- decision boundary
- axis parallel
- pattern classification
- digital circuits
- fault diagnosis
- mercer kernels
- training samples
- neural network
- support vector machine
- nearest neighbor
- hyperplane
- data distribution
- training set
- data points
- test cases
- support vectors
- kernel function
- unlabeled data
- pattern recognition
- training data