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Developing digital test sequences for through-silicon vias within 3D structures.

Matthias GulbinsFabian HopschPeter SchneiderBernd StraubeWolfgang Vermeiren
Published in: 3DIC (2010)
Keyphrases
  • test sequences
  • high density
  • test cases
  • bit rate
  • test generation
  • video sequences
  • mutation testing
  • integrated circuit
  • field effect transistors
  • low cost
  • high speed
  • liquid crystal