Comparison between WLD and LBP descriptors for non-intrusive image forgery detection.
Muhammad HussainSahar Q. SalehHatim A. AboalsamhMuhammad GhulamGeorge BebisPublished in: INISTA (2014)
Keyphrases
- forgery detection
- digital images
- feature descriptors
- image features
- sift descriptors
- image data
- local binary pattern
- image analysis
- spatial information
- multiscale
- image editing
- test images
- edge detection
- image capture
- input image
- high resolution
- texture features
- image segmentation
- jpeg compression
- maximum likelihood
- wavelet transform
- texture descriptors
- feature vectors
- feature space
- face recognition