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Combinational Test Generation for Acyclic SequentialCircuits using a Balanced ATPG Model.
Yong Chang Kim
Kewal K. Saluja
Vishwani D. Agrawal
Published in:
VLSI Design (2001)
Keyphrases
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high level
pattern matching
probabilistic model
artificial intelligence
information systems
video sequences
np complete
test cases
test generation