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Combinational Test Generation for Acyclic SequentialCircuits using a Balanced ATPG Model.

Yong Chang KimKewal K. SalujaVishwani D. Agrawal
Published in: VLSI Design (2001)
Keyphrases
  • high level
  • pattern matching
  • probabilistic model
  • artificial intelligence
  • information systems
  • video sequences
  • np complete
  • test cases
  • test generation