Test Data Compression and Test Resource Partitioning for System-on-a-Chip Using Frequency-Directed Run-Length (FDR) Codes.
Anshuman ChandraKrishnendu ChakrabartyPublished in: IEEE Trans. Computers (2003)
Keyphrases
- test data
- run length
- run length encoding
- compression rate
- test cases
- gray level
- training data
- test set
- data sets
- testing process
- compression ratio
- data compression
- training and test data
- video compression
- search based testing
- software testing
- error correction
- compression scheme
- compression algorithm
- image compression
- training set
- feature extraction
- coding scheme
- computer vision