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NEST: a nonenumerative test generation method for path delay faults in combinational circuits.

Irith PomeranzSudhakar M. ReddyPrasanti Uppaluri
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1995)
Keyphrases
  • generation method
  • built in self test
  • test cases
  • integrated circuit
  • logic circuits
  • fault diagnosis
  • web services
  • shortest path
  • ad hoc networks
  • analog circuits
  • tunnel diode