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Derivation of Optimal Test Set for Detection of Multiple Missing-Gate Faults in Reversible Circuits.
Dipak Kumar Kole
Hafizur Rahaman
Debesh K. Das
Bhargab B. Bhattacharya
Published in:
Asian Test Symposium (2010)
Keyphrases
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test set
training set
test cases
error rate
test data
training data
object detection
high speed
multiple input
evaluation methodology
fault diagnosis
detection method
detection rate
class distribution
semi supervised
multi class
automated detection
cmos technology
video sequences