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Automatic test generation for stuck-open faults in CMOS VLSI.
Yacoub M. El-Ziq
Published in:
DAC (1981)
Keyphrases
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test generation
test cases
mutation testing
high speed
vlsi circuits
symbolic execution
test sequences
design automation
low cost
static analysis
quality assurance
single chip
chip design
signal processing
power consumption
software testing
test data generation
power dissipation
image processing
learning algorithm