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A Density Metric for Semiconductor Technology [Point of View].

H.-S. Philip WongKerem AkarvardarDimitri A. AntoniadisJeffrey BokorChenming HuTsu-Jae King LiuSubhasish MitraJames D. PlummerSayeef S. Salahuddin
Published in: Proc. IEEE (2020)
Keyphrases
  • rapid development
  • case study
  • e government
  • data processing
  • key technologies
  • distance metric
  • metric space
  • evaluation metrics
  • technological advances