Parallel Genetic Algorithms for Simulation-Based Sequential Circuit Test Generation.
Dilip KrishnaswamyMichael S. HsiaoVikram SaxenaElizabeth M. RudnickJanak H. PatelPrithviraj BanerjeePublished in: VLSI Design (1997)
Keyphrases
- test generation
- parallel genetic algorithms
- test cases
- symbolic execution
- test sequences
- parallel genetic algorithm
- design automation
- software testing
- static analysis
- quality assurance
- circuit design
- mutation testing
- test data generation
- relational databases
- artificial intelligence
- evolutionary algorithm
- code coverage
- software systems
- image quality
- training data
- island model
- real world