Transistor-level test generation for physical failures in CMOS circuits.

Hsi-Ching Shih Jacob A. Abraham

Published in: DAC (1986)

Keyphrases

test generation
high speed
circuit design
design automation
power dissipation
low power
floating gate
analog vlsi
test cases
delay insensitive
power consumption
low cost
cmos technology
integrated circuit
software testing
symbolic execution
vlsi circuits
data sets
real world
static analysis
test sequences