On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs.
Shianling WuLaung-Terng WangZhigang JiangJiayong SongBoryau SheuXiaoqing WenMichael S. HsiaoJames Chien-Mo LiJiun-Lang HuangRavi AptePublished in: DFT (2008)