A Test Method for Large-size TSV Considering Resistive Open Fault and Leakage Fault Coexistence.
Chang HaoXu YongTianming NiPublished in: VLSI-DAT (2021)
Keyphrases
- high precision
- error rate
- detection method
- high accuracy
- objective function
- evaluation method
- computational complexity
- optimization method
- cost function
- test data
- classification method
- clustering method
- fully automatic
- theoretical analysis
- fault diagnosis
- segmentation method
- fault detection
- neural network
- mutual information
- principal component analysis
- computational cost
- dynamic programming
- significant improvement
- preprocessing
- multiscale
- similarity measure