Embedded Processor Based Built-In Self-Test and Diagnosis of Logic and Memory Resources in FPGAs.
Daniel T. MiltonSachin DhingraCharles E. StroudPublished in: ESA (2006)
Keyphrases
- built in self test
- random access memory
- embedded systems
- dynamic random access memory
- integrated circuit
- resource consumption
- memory management
- computing power
- field programmable gate array
- smart camera
- resource management
- high speed
- hardware implementation
- intel xeon
- embedded processors
- memory subsystem
- processing elements
- memory hierarchy
- medical diagnosis
- limited resources
- level parallelism
- fault diagnosis
- processor core
- embedded dram
- parallel architectures
- hardware software
- modal logic
- resource allocation
- memory access
- multithreading
- computer architecture
- fault models
- model based diagnosis
- associative memory
- single instruction multiple data
- parallel processing
- main memory
- computer systems