Partial Reset and Scan for Flip-Flops Based on States Requirement for Test Generation.

Hsing-Chung Liang Chung-Len Lee Jwu E. Chen

Published in: VTS (1998)

Keyphrases

test generation
test cases
flip flops
symbolic execution
test sequences
static analysis
quality assurance
design automation
multiple input
software testing
real time
databases
image processing
training data
pattern recognition
master slave