Evaluating Built-in ECC of FPGA on-chip Memories for the Mitigation of Undervolting Faults.
Behzad SalamiOsman S. UnsalAdrián Cristal KestelmanPublished in: CoRR (2019)
Keyphrases
- high speed
- single chip
- low cost
- digital signal processors
- built in self test
- programmable logic
- fault diagnosis
- real time
- field programmable gate array
- low power consumption
- error correction
- test cases
- fault detection
- software implementation
- real time image processing
- reconfigurable hardware
- systolic array
- image processing
- image sensor
- low power
- evolvable hardware
- fault model
- hardware design
- elliptic curve cryptography
- model based diagnosis
- hardware implementation