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Multi-valued logic mapping of resistive short and open delay-fault testing in deep sub-micron technologies.
M. Reza Javaheri
Reza Sedaghat
Published in:
Microelectron. Reliab. (2009)
Keyphrases
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fault model
data mining
fault diagnosis
fault detection
test cases
real time embedded systems
database
emerging technologies
fault injection
data sets
multimedia
information technology
future development
open systems
open standards