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RT-level design-for-testability and expansion of functional test sequences for enhanced defect coverage.
Alodeep Sanyal
Krishnendu Chakrabarty
Mahmut Yilmaz
Hideo Fujiwara
Published in:
ITC (2010)
Keyphrases
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test sequences
design process
data sets
case study
bit rate
test cases
neural network
learning algorithm
computational complexity
knowledge based systems
development process
design principles
functional verification