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MEMS fault model generation using CARAMEL.

Abhijeet KolpekwarChris S. KellenRonald D. Blanton
Published in: ITC (1998)
Keyphrases
  • fault diagnosis
  • fault detection
  • multiple faults
  • computer vision
  • fault model
  • information retrieval
  • knowledge base
  • image segmentation
  • fault models