Login / Signup
Fault Testing for Reversible Circuits.
Ketan N. Patel
John P. Hayes
Igor L. Markov
Published in:
VTS (2003)
Keyphrases
</>
fault model
fault diagnosis
fault detection
fault models
real time embedded systems
fault injection
neural network
vlsi circuits
artificial intelligence
case study
high speed
source code
software testing
analog circuits
failure modes
quantum computing