Fast on-chip inductance simulation using a precorrected-FFT method.
Haitian HuDavid T. BlaauwVladimir ZolotovKaushik GalaMin ZhaoRajendran PandaSachin S. SapatnekarPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2003)
Keyphrases
- objective function
- simulation study
- mathematical model
- computationally efficient
- fourier domain
- detection method
- cost function
- computational complexity
- experimental evaluation
- high precision
- classification method
- synthetic data
- fast fourier transform
- feature vectors
- preprocessing
- segmentation method
- optimization algorithm
- similarity measure
- high accuracy
- dynamic programming
- significant improvement
- prior knowledge