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Single-fault fault-collapsing analysis in sequential logic circuits.

Jwu E. ChenChung-Len LeeWen-Zen Shen
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1991)
Keyphrases
  • fault diagnosis
  • fault detection
  • logic circuits
  • image analysis
  • image processing
  • object oriented
  • low cost
  • distributed systems
  • load balancing
  • medical imaging
  • low power
  • fault model