Login / Signup

Fault Collapsing in Digital Circuits Using Fast Fault Dominance and Equivalence Analysis with SSBDDs.

Raimund UbarLembit JürimägiElmet OrassonJaan Raik
Published in: VLSI-SoC (Selected Papers) (2015)
Keyphrases
  • digital circuits
  • fault diagnosis
  • statistical analysis
  • fault detection
  • quantitative analysis
  • learning algorithm
  • data analysis
  • low cost
  • source code
  • qualitative analysis