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On the Automatic Generation of Software-Based Self-Test Programs for Functional Test and Diagnosis of VLIW Processors.

Davide SabenaLuca SterponeMatteo Sonza Reorda
Published in: VLSI-SoC (Selected Papers) (2012)
Keyphrases
  • software testing
  • test data
  • control flow
  • software design
  • test data generation
  • fault diagnosis
  • software tools
  • software maintenance
  • test suite
  • root cause
  • fault localization