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Behavior-level yield enhancement approach for large-scaled analog circuits.

Chin-Cheng KuoYen-Lung ChenI-Ching TsaiLi-Yu ChanChien-Nan Jimmy Liu
Published in: DAC (2010)
Keyphrases
  • analog circuits
  • digital circuits
  • image processing
  • fault diagnosis
  • neural network
  • higher level
  • input output
  • pattern recognition
  • expert systems
  • constraint satisfaction
  • behavior patterns