Behavior-level yield enhancement approach for large-scaled analog circuits.

Chin-Cheng Kuo Yen-Lung Chen I-Ching Tsai Li-Yu Chan Chien-Nan Jimmy Liu

Published in: DAC (2010)

Keyphrases

analog circuits
digital circuits
image processing
fault diagnosis
neural network
higher level
input output
pattern recognition
expert systems
constraint satisfaction
behavior patterns