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Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving.
Zhiyuan He
Zebo Peng
Petru Eles
Paul M. Rosinger
Bashir M. Al-Hashimi
Published in:
J. Electron. Test. (2008)
Keyphrases
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test set
test data
test cases
error rate
training set
random selection
training data
infrared
scheduling algorithm
evaluation methodology
scheduling problem
training and test sets
database
feature extraction
low power
class distribution