Local Binary Pattern Features to Detect Anomalies in Machined Workpiece.
Lidia Sánchez-GonzálezVirginia RiegoManuel Castejón LimasLaura Fernández-RoblesPublished in: HAIS (2020)
Keyphrases
- local binary pattern
- feature vectors
- anomaly detection
- detect anomalies
- texture classification
- feature extraction
- texture information
- feature descriptors
- co occurrence
- spatial information
- rotation invariant
- classification accuracy
- texture descriptors
- image descriptors
- multiscale
- texture analysis
- learning algorithm
- feature space
- face recognition
- image features
- pattern recognition
- pairwise