X ray nanoprobe for fault attacks and circuit edits on 28-nm integrated circuits.
S. BouatStéphanie AnceauLaurent MaingaultJessy ClédièreLuc SalvoRémi TucoulouPublished in: DFT (2023)
Keyphrases
- x ray
- integrated circuit
- metal oxide semiconductor
- transmission electron microscopy
- electron beam lithography
- electron beam
- hardware description language
- metal oxide
- digital x ray images
- medical imaging
- x ray images
- ct scans
- three dimensional
- intraoperative
- cmos technology
- high speed
- low dose
- electron microscopy
- printed circuit boards
- guide wire
- low cost
- projection images
- tomographic images
- medical images
- image quality
- high resolution