OLED panel defect detection using local inlier-outlier ratios and modified LBP.
Vishwanath A. SindagiSumit SrivastavaPublished in: MVA (2015)
Keyphrases
- defect detection
- feature extraction
- local binary pattern
- automated visual inspection
- textured surfaces
- outlier detection
- face recognition
- image processing
- texture analysis
- databases
- spatial information
- prior information
- false matches
- single image
- graphical models
- knowledge discovery
- texture classification
- prior knowledge
- multiscale
- light emitting