Test Cycle Count Reduction in a Parallel Scan BIST Environment.
Bechir AyariPrab VarmaPublished in: Asian Test Symposium (1998)
Keyphrases
- complex environments
- parallel processing
- dynamic environments
- information retrieval
- test cases
- built in self test
- real time
- parallel computation
- simulation environment
- statistical significance
- parallel implementation
- statistical tests
- virtual world
- mobile robot
- website
- decision making
- information systems
- artificial intelligence
- genetic algorithm
- data mining
- real world