Topography and force imaging in atomic force microscopy by state and parameter estimation.
Michael R. P. RagazzonJan Tommy GravdahlKristin Ytterstad PettersenArnfinn Aas EielsenPublished in: ACC (2015)
Keyphrases
- parameter estimation
- atomic force microscopy
- model selection
- maximum likelihood
- least squares
- markov random field
- statistical models
- em algorithm
- parameter estimation algorithm
- random fields
- maximum likelihood estimation
- approximate inference
- image analysis
- structure learning
- parameter values
- posterior distribution
- parameter estimates
- model fitting
- computer vision
- medical imaging
- expectation maximization
- medical images
- bayesian model selection
- estimation problems
- bayesian networks
- gibbs sampling
- imaging systems
- pairwise
- high resolution