Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology.

Vishal J. Mehta Malgorzata Marek-Sadowska Kun-Han Tsai Janusz Rajski

Published in: ITC (2006)

Keyphrases

case study
cost effective
model based diagnosis
medical diagnosis
key technologies
data sets
fault diagnosis
automatic diagnosis
data mining
machine learning
rapid development
st century
technological advances
defect detection