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Compact and complete test set generation for multiple stuck-faults.

Alok AgrawalAlexander SaldanhaLuciano LavagnoAlberto L. Sangiovanni-Vincentelli
Published in: ICCAD (1996)
Keyphrases
  • test set
  • error rate
  • training set
  • test cases
  • training data
  • evaluation methodology
  • test data
  • class distribution
  • fault detection
  • data sets
  • machine learning
  • object detection
  • fault model