Statistical timing for parametric yield prediction of digital integrated circuits.
Jochen A. G. JessKerim KalafalaSrinath R. NaiduRalph H. J. M. OttenChandramouli VisweswariahPublished in: DAC (2003)
Keyphrases
- integrated circuit
- prediction accuracy
- prediction error
- prediction algorithm
- statistical methods
- electron beam
- information theoretic
- prediction model
- metal oxide semiconductor
- statistical modeling
- statistical models
- data driven
- digital media
- asynchronous circuits
- digital technologies
- predictive modeling
- statistical significance
- predictive model
- hypothesis testing
- machine learning
- digital content
- metadata