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Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps.
Vamsi Putcha
Jacopo Franco
Abhitosh Vais
Ben Kaczer
S. Sioncke
Dimitri Linten
Guido Groeseneken
Published in:
IRPS (2018)
Keyphrases
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genetic algorithm ga
genetic algorithm
neural network
fitness function
high impact
metaheuristic
hybrid genetic algorithm
field effect transistors
low cost
optimal solution
multi objective
simulated annealing
fault diagnosis
data acquisition
hybrid algorithm
hybrid ga