Statistical Diagnosis for Quality-Related Faults in BIW Assembly Process.

Yu-Kai Fu Guang-Hong Yang Hong-Jun Ma Hao Chen Bo Zhu

Published in: IEEE Trans. Ind. Electron. (2023)

Keyphrases

fault diagnosis
model based diagnosis
multiple faults
fault detection
fault detection and diagnosis
computer vision
assembly process
high quality
statistical analysis
statistical models
computer aided
data quality
root cause
fault model