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Statistical Diagnosis for Quality-Related Faults in BIW Assembly Process.
Yu-Kai Fu
Guang-Hong Yang
Hong-Jun Ma
Hao Chen
Bo Zhu
Published in:
IEEE Trans. Ind. Electron. (2023)
Keyphrases
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fault diagnosis
model based diagnosis
multiple faults
fault detection
fault detection and diagnosis
computer vision
assembly process
high quality
statistical analysis
statistical models
computer aided
data quality
root cause
fault model