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A New Framework of Simultaneous-Fault Diagnosis Using Pairwise Probabilistic Multi-Label Classification for Time-Dependent Patterns.
Chi-Man Vong
Pak-Kin Wong
Weng-Fai Ip
Published in:
IEEE Trans. Ind. Electron. (2013)
Keyphrases
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fault diagnosis
pairwise
neural network
expert systems
probabilistic model
multi label classification
fault detection
multiple faults
multiscale
fuzzy logic
multi label
monitoring and fault diagnosis
chemical process
rbf neural network
multi class
bayesian networks
similarity measure