Login / Signup

A Multimode Transverse Dynamic Force Microscope - Design, Identification, and Control.

Kaiqiang ZhangToshiaki HatanoGuido HerrmannMassimo AntognozziChristopher EdwardsThang Nguyen-TienStuart C. BurgessMervyn J. Miles
Published in: IEEE Trans. Ind. Electron. (2020)
Keyphrases