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High-Level Decision Diagrams based coverage metrics for verification and test.

Maksim JenihhinJaan RaikAnton ChepurovUljana ReinsaluRaimund Ubar
Published in: LATW (2009)
Keyphrases
  • high level
  • decision diagrams
  • test suite
  • test cases
  • binary decision diagrams
  • multi valued
  • lower bound
  • image data
  • markov decision processes
  • efficient computation
  • digital circuits