A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs.
Prateek SharmaStanislav TyaginovStewart E. RauchJacopo FrancoBen KaczerAlexander MakarovMikhail I. VexlerTibor GrasserPublished in: ESSDERC (2016)