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Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies.

Ilia PolianSandip KunduJean Marc GallièrePiet EngelkeMichel RenovellBernd Becker
Published in: VTS (2005)
Keyphrases
  • fault model
  • safety analysis
  • high speed
  • fault injection
  • low power
  • model based diagnosis
  • emerging technologies
  • cost effective
  • integrated circuit
  • electron beam
  • data mining
  • vlsi circuits