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Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies.
Ilia Polian
Sandip Kundu
Jean Marc Gallière
Piet Engelke
Michel Renovell
Bernd Becker
Published in:
VTS (2005)
Keyphrases
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fault model
safety analysis
high speed
fault injection
low power
model based diagnosis
emerging technologies
cost effective
integrated circuit
electron beam
data mining
vlsi circuits