PODEM-X: An automatic test generation system for VLSI logic structures.

Prabhakar Goel Barry C. Rosales

Published in: DAC (1981)

Keyphrases

test generation
test cases
design automation
test sequences
signal processing
static analysis
symbolic execution
database
information technology
logic programming
quality assurance
mutation testing
software testing
modal logic
error rate
open source
multi agent systems
high level
image processing
machine learning