An Optimum ORA BIST for Multiple Fault FPGA Look-Up Table Testing.

Armin Alaghi Mahnaz Sadoughi Yarandi Zainalabedin Navabi

Published in: ATS (2006)

Keyphrases

neural network
real time
hardware implementation
low cost
signal processing
fault diagnosis
test cases
fault injection
fault model
combining multiple
fault detection
global optimum
power consumption
test set
high speed
image processing
data sets